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Join us for a live
Rohde & Schwarz webinar May 13, 2020
at 2:00 pm ET.
In the third video, we will introduce the
concept of Time Domain Reflectometry and
compare the VNA- and Oscilloscope-based TDR
approaches, highlighting advantages and
disadvantages of each, with demonstrations.
By registering for
this webinar you will also have full access
to the entire Test &
Measurement Resource Center, a digital
content hub for education and real-world
technical information.
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Greg
Bonaguide is a Senior Applications
Engineer for Rohde & Schwarz,
specializing in Spectrum Analyzer
and Vector Network Analyzer
technology. He has worked in the RF
& Microwave field since 1982 in
Design, Systems Engineering, and
Test & Measurement roles. His
experience includes stints with both
Commercial and Aerospace/Defense
companies such as the American Radio
Relay League, Cubic Corporation,
E-Systems, GTE Spacenet, Philips
Semiconductors, and Raytheon. He
holds Masters Degrees in both
Electrical Engineering and
Engineering Management from the
University of South Florida, and has
published in journals such as QST,
the ARRL Handbook, Microwaves &
RF, Test & Measurement World,
and Evaluation Engineering. He has
also authored and delivered several
MicroApps presentations at past
IEEE-MTT shows. He served on the
2016 EDI CON Technical Advisory
Committee, was co-chairman for the
2014 International Microwave
Symposium (IMS) Microwave
Application Seminars (MicroApps),
and served as Chairman of the IEEE
Florida West Coast Section MTT/AP/ED
Societies. He recently published The
VNA Applications Handbook through
Artech House.
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Greg Bonaguide, Application
Engineer
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